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DOI:
Journal of Software:2010.21(12):2999-3010

软件缺陷发现时序过程的叠加双阻尼振荡模型
何智涛,晏海华,刘超
()
Accumulative Bi-Damped Oscillation Model for the Sequential Process of Software Defect Discovery
HE Zhi-Tao,YAN Hai-Hua,LIU Chao
()
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Received:February 11, 2009    Revised:July 09, 2009
> 中文摘要: 在软件测试实践中,被测软件通常要经历多轮次的测试和修改过程.由于受到被测软件的缺陷分布、迭代式的开发与测试过程、测试者发现缺陷的能力等诸多非确定性因素的影响,使得软件缺陷发现的时序过程呈现出相应的周期性、随机振荡性和阻尼衰减等时序特征.通过对以软件缺陷发现为目标、测试过程管理规范的软件测试过程基本特征和关键影响因素的深入分析,提出了一种描述软件缺陷发现时序过程特征的叠加双阻尼振荡模型(accumulative bi-damped oscillation model,简称ABDOM).采用从两个真实软件测试项目中采集的缺陷发现过程数据,检验了ABDOM模型的有效性,定义了ABDOM模型的适用范围,并对ABDOM模型的应用进行了初步讨论.
Abstract:In software testing practice, usually, the software under test (SUT) experiences multiple iterative processes of testing and modification. With the influence of many uncertain factors, such as defect distribution in the software under test, iterative developing and testing processes, and testers’ capabilities of defect detection, the software defect discovery process shows that the sequential characteristics correspond with test cycles, i.e. periodicity, random oscillation, and attenuation. Through a deep analysis of the basic characters and key influencing factors of the controlled software testing process, the paper proposes an Accumulative Bi-Damped Oscillation Model (ABDOM), which describes periodicity, random oscillation, and attenuation for a sequential software defect discovery process. It verifies ABDOM’s validity with defect data gathered from 2 true software test projects, and discusses the application scope of ABDOM and the possible applications in test predication and evaluation.
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基金项目:Supported by the National Natural Science Foundation of China under Grant No.90718018 (国家自然科学基金) Supported by the National Natural Science Foundation of China under Grant No.90718018 (国家自然科学基金)
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Author NameAffiliation
HE Zhi-Tao  
YAN Hai-Hua  
LIU Chao  
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何智涛,晏海华,刘超.软件缺陷发现时序过程的叠加双阻尼振荡模型.软件学报,2010,21(12):2999-3010

HE Zhi-Tao,YAN Hai-Hua,LIU Chao.Accumulative Bi-Damped Oscillation Model for the Sequential Process of Software Defect Discovery.Journal of Software,2010,21(12):2999-3010