随着嵌入式计算机系统应用的不断扩展，嵌入式系统的可靠性引起了学术界和工业界的广泛关注，也提出了很多增进可靠性的方法和技术.然而，现有的方法和技术在测试套生成方面论述不多，所以在处理大批量嵌入式系统测试工作中遇到了挑战.讨论抽象测试套生成方法和适配技术，提出了LTS(labeled transition system)到BT(behavior tree)的转换算法，从而使TTCN(test and testing control notation)测试套可以通过转换嵌入式软件的LTS描述产生.还介绍了基于上述转换算法的嵌入式软件测试工具包，以及一个嵌入式物联网识读器测试案例研究.
With the rapid increase of embedded computer system applications, the reliability of embedded software has drawn particular attention from researchers and industries. Many methods for testing and verifying reliability of embedded software have been discussed. However, the existing methods are weak in test suite automatic generation and therefore difficult in tackling large numbers of embedded computer applications. In this paper, the method and the technique of generating abstract test suite and their adaptation to a computer platform are presented. An algorithm for translating a LTS (labeled transition system) into BT (behavior tree) is proposed. Consequently, the TTCN (test and testing control notation) abstract test suite that employs BT as logical structure can automatically be generated with respect to the LTS description of embedded software. A TTCN tool set based on the translation algorithm for testing embedded software is introduced, and case study of testing embedded system of Internet of things device is presented.